By Robert A. Schwarzer, David P. Field (auth.), Adam J. Schwartz, Mukul Kumar, Brent L. Adams, David P. Field (eds.)
Electron backscatter diffraction (EBSD), whilst hired as an extra characterization strategy to a scanning electron microscope (SEM), allows person grain orientations, neighborhood texture, point-to-point orientation correlations, and section id and distributions to be decided usually at the surfaces of bulk polycrystalline fabrics. the applying has skilled speedy popularity in metallurgical, fabrics, and geophysical laboratories in the prior decade end result of the broad availability of SEMs, the convenience of pattern instruction from the majority, the excessive velocity of knowledge acquisition, and the entry to complimentary information regarding the microstructure on a submicron scale.
This totally new moment variation describes the entire EBSD strategy, from the experimental set-up, representations of textures, and dynamical simulation, to energy-filtered, round, and 3D EBSD, to section id, in situ experiments, pressure mapping, and grain boundary networks, to the layout and modeling of fabrics microstructures. various program examples together with the research of deformation microstructure, dynamic deformation and harm, and EBSD stories within the earth sciences supply info of this robust fabrics characterization technique.
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Additional resources for Electron Backscatter Diffraction in Materials Science
An essential requirement is a clean vacuum in the specimen chamber in order to exclude excessive formation of carbon contamination. A turbomolecular pump backed by a dry roughing pump is therefore recommended, while greased vacuum sealings should be avoided. The specimen stage should accommodate large specimens and a eucentric tilt from 0◦ to about 75◦ from the horizontal plane. The x–y translation should be made in the surface plane of the specimen. A free port of at least 5 cm wide is required at normal direction to the tilt axis of the stage about 1 cm beneath the eucentric point, for mounting the camera and the phosphor screen.
Tulinov, Lomonosov Moscow State University, and Uspekhi Fizicheskikh Nauk, Moscow. RS would like to thank Prof. Dr. U. Wendt, University of Magdeburg, Germany, for kindly providing the orientation contrast micrograph in Fig. 8. S. Department of Energy at Lawrence Livermore National Laboratory under Contract DEAC52-07NA27344. References Adams BL, Wright SI, Kunze K (1993) Orientation imaging: The emergence of a new microscopy. Met Trans 24A: 819–831 Alam MN, Blackman M, Pashley DW (1954) High-angle Kikuchi patterns.
In this way, we 2 Dynamical Simulation of Electron Backscatter Diffraction Patterns 23 tislice and the Bloch wave approaches. One can in principle use these existing approaches for TEM simulations to also simulate EBSD patterns (disregarding numerical limitations). We just have to appropriately account for the property of the diffracted wave field that is observed in EBSD: the probability density inside the crystal at the atomic positions P. Fig. 2 Application of the reciprocity principle for EBSD calculations: (a) EBSD patterns are formed by elastic scattering of electrons which are emitted into all directions from a point source at P.